HOMMEL NANOSCAN 855
Producer:
- JENOPTIK Industrial Metrology Germany
TWO IN ONE
HOMMEL nanoscan 855 combined device for simultaneous control of roughness and surface contour in one pass.
ULTRA-PRECISE OPTICAL-MECHANICAL MEASURING SYSTEM
For a synchronous measurement of roughness characteristics and surface contours on curvilinear and inclined surfaces, a high-precision measuring system with a wide measuring range is necessary. HOMMEL nanoscan 855 is a SUPER-accurate measuring system with a resolution of 0.6 nanometers on a range of 24 mm. Simultaneously with high accuracy of the movement, this device has excellent accuracy characteristics of the parameters of the micro geometry and the contour in a wide range.
AUTOMATED MEASUREMENT CYCLE
The nanoscan 855 roughness testing station, together with high accuracy, provides a high speed measurement completely in the CNC mode, which guarantees high productivity in quality control.
Functional characteristics
- Ergonomic design
- Active vibration reduction system
- Station management with a joystick
- Measure the roughness and contour in one pass
- There is no need to level the surface before measurement, which saves time
- Ability to measure roughness on spheres
- Ultra-low internal noises
- Suitable for measuring high-purity surfaces
- Measurement of parameters of profile elements with high accuracy:
circle (radius, diameters, center-to-center distances), sections of the contour (distances, angles, steps, straightness, auto-alignment), etc.
Specifications
Parameter | measur. units | value |
In horizontal plane | ||
Trace length | mm | 0,1 … 200 |
Trace speed | mm/s | 0,05 … 10 |
Measuring speed | mm/s | 0,05 … 5 |
Data sampling interval | mkm | 0,01 … 10 |
Straightness of running | mkm/mm | 0,4 / 200 |
In vertical plane | ||
Measuring range | mm | 24 |
Resolution | nm | 0,6 |
Measuring force | mN | ±0,5 … 50 |
No accessories for this product.