Laboratory instrument for checking the roughness of the highest accuracy class with a personal computer. It is intended for definition of all usual parameters of a roughness under norms operating now, calculation of special parameters. Unlimited number of measuring programs and protocols. The ability to use any printer supported by Windows. The ability to interface with all Windows programs, such as Winword, Excel, Write, Access, etc. It is possible to control micro- and macro profiles, as well as determine the topography of the surface.

Main specifications.
Accuracy class according to DIN 4772: 1.
Measuring ranges:

• +/- 8 microns (resolution 1 nm);
• +/- 80 microns (resolution 10 nm);
• +/- 800 microns (resolution of 100 nm);
• +/- 8000 microns (resolution of 1000 nm).

Filters: RC (DIN 4768), M1 (DIN EN ISO 11562-1), M2 (DIN EN ISO 13565-1) and others according to ISO 3274/11562.

Measured roughness parameters: Ra, Rz, Rmax, Rt, Rq, Rsk, Imo, Io, Idq, da, ln, La, Rz-ISO, R3z, Rpm, Rp3z, R3zm, Rp, D, Rpc, RSm, Rpm / R3z, lr, Rku, tpif, tpia, tpip, tpic, Rt / Ra, Rz1, Rz2, Rz3, Rz4, Rz5, Rmr, Rmr%, Api on DIN EN ISO 4287. Rk parameters according to DIN EN ISO 13565: Rpk *, Rpk, Rk, Rvk, Rvk *, Mr1, Mr2, A1, A2, Vo (70%) 0.01 *, Rv / Rk

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Interface languages: German, English, French, Italian, Spanish, Czech.

Design features: The roughness and profile inspector uses the latest Waveline 120 feed device to control roughness using CAN-BUS technology. Closed compact casing with built-in illuminated display, for displaying all system messages and position. Soft keyboard for positioning the quill with 3 speed steps. Built-in high-precision reference plane.